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Перегляд Functional Materials, 2005, том 12 за автором "Poperenko, L.V."

Репозиторій DSpace/Manakin

Перегляд Functional Materials, 2005, том 12 за автором "Poperenko, L.V."

Сортувати за: Порядок: Результатів:

  • Ellipsometric control of stress homogeneity in surface layer of amorphous metal alloy ribbons 
    Poperenko, L.V.; Ozerov, M.V. (Functional Materials, 2005)
    The level of internal strain changes in the subsurface layer of Fe-based (Fe₇₅Ni₄Мо₃Si₂В₁₆ and Fe₈₀В₂₀) amorphous metal alloys has been analyzed. Optical measurements were carried out for as-cast ribbons. . The noncircular ...
  • Ellipsometric study of ion implanted copper surface and its room temperature oxidation 
    Poperenko, L.V.; Lohner, T.; Stashchuk, V.S.; Khanh, N.Q.; Vinnichenko, M.V.; Yurgelevych, I.V.; Essam Ramadan Shaaban; Nosach, D.V. (Functional Materials, 2005)
    The room temperature oxidation of ion-implanted copper surface has been studied ex situ and in situ using ellipsometry. The ellipsometric parameters T and Д were measured at light incidence angle 75° for different wavelength ...
  • Influence of irradiation by a particle beam on optical properties of metal mirrors 
    Poperenko, L.V.; Vinnichenko, M.V.; Kosel, P.B.; Vinnichenko, K.L. (Functional Materials, 2005)
    The surface of copper and stainless steel mirrors near the area destroyed by electron beam has been characterized by means of ellipsometric diagnostics. The treatment did not result in any changes in the surface microrelief, ...
  • Influence of oxide layers on optical properties of copper in a wide spectral range 
    Filipov, Y.V.; Staschuk, V.S.; Poperenko, L.V. (Functional Materials, 2005)
    Optical properties of flawless bulk copper sample has been studied based on spectroel-lipsometry measurements in a wide spectral interval (Av = 0.18 to 4.87 eV) at various angles of light incidence. The main characteristics ...
  • Optical properties of TiAISiN based thin films 
    Nakonechna, O.I.; Poperenko, L.V.; Yurgelevych, I.V. (Functional Materials, 2005)
    Spectroellipsometric investigations of optical properties of TiAISiN based thin films have been performed. The dispersive dependences of the film optical conductivity о have been obtained in the 1-5 eV spectral range. The ...
  • TMR, MRE, and X-ray photoelectron spectroscopy of Fe-SiO₂ granular films 
    Kravets, V.G.; Poperenko, L.V.; Vinnichenko, K.L. (Functional Materials, 2005)
    Feₓ(Si0₂)₁₋ₓ magnetic granular films below the percolation threshold (х < 0.45) have been studied using tunneling magnetoresistance (TMR), magnetorefractive effect (MRE), and X-ray photoelectron spectroscopy. Maximum ...

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