Перегляд Functional Materials за автором "Reshetnyak, E.N."

Результати 1-3 з 3

Radiation resistance of Ti—20Zr alloy in microcrystalline and nanocrystalline state

Belous, V.A.; Borodin, O.V.; Bryk, V.V.; Vasilenko, R.L.; Voyevodin, V.N.; Kuprin, A.S.; Ovcharenko, V.D.; Reshetnyak, E.N.; Tolmachova, G.N. (Functional Materials, 2013)

In this work we studied structure of Ti—20Zr alloy in recrystallized and nanocrystalline conditions before and after irradiation by Zr³⁺ ions with energy 1.8 MeV to 80 dpa at 500° C. By transmission electron microscopy ...
Structure and stress state of ion-plasma hafnium condensates

Vus, A.S.; Malykhin, S.V.; Pugachev, A.T.; Reshetnyak, E.N.; Azhazha, R.V.; Kovtun, K.V. (Functional Materials, 2007)

The 0.05-0.5 μm trick films have been obtained from GFE-1 grade hafnium target by magnetron sputtering using argon ions. Purity of the obtained films was controlled by X-ray fluorescence spectroscopy. The structure of films ...
Surface morphology and structure of nanocrystalline diamond films deposited in CH₄/H₂/Ar glow discharge plasma

Vyrovets, I.I.; Gritsyna, V.I.; Dudnik, S.F.; Opalev, O.A.; Reshetnyak, E.N.; Strel'nitskiy, V.E. (Functional Materials, 2009)

Diamond films of up to 12 μm thickness have been deposited onto single crystal silicon substrates by CVD method in CH₄/H₂/Ar glow discharge plasma stabilized by magnetic field. X-ray diffraction analysis and atomic force ...

Результати 1-3 з 3

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