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dc.contributor.author Buchenko, V.V.
dc.contributor.author Goloborodko, A.A.
dc.date.accessioned 2017-06-14T08:20:30Z
dc.date.available 2017-06-14T08:20:30Z
dc.date.issued 2016
dc.identifier.citation Bi nanolines characterization by linear optical methods / V.V. Buchenko, A.A. Goloborodko // Functional Materials. — 2016. — Т. 23, № 3. — С. 387-393. — Бібліогр.: 46 назв. — англ. uk_UA
dc.identifier.issn 1027-5495
dc.identifier.other DOI: dx.doi.org/10.15407/fm23.03.387
dc.identifier.uri http://dspace.nbuv.gov.ua/handle/123456789/121381
dc.description.abstract The present paper dedicated to experimental investigations of optical properties of Bi/Si(001) interfaces and Bi nanolines in a wide spectral range (1eV). The experimental study of optical absorption spectrum showed the widening of the optical band gap of Bi/Si(001) interfaces with increasing the bismuth coverage, whereas after nanolines formation the width of the optical band gap decreases. Features of the experimentally obtained reflectance anisotropy spectra and surface differential reflectance spectra concerned with changing of the silicon surface reconstruction from 2x1 to 1x1 with the increasing of the bismuth covering degree from 0.5 ML to 1 ML. The experimental study of reflectance anisotropy spectra and surface differential reflectance spectra of Bi nanolines shows that the bismuth atoms are still present on the surface of the substrate in small amount, but the optical properties of such structures are determined by Si dimers. uk_UA
dc.language.iso en uk_UA
dc.publisher НТК «Інститут монокристалів» НАН України uk_UA
dc.relation.ispartof Functional Materials
dc.subject Characterization and properties uk_UA
dc.title Bi nanolines characterization by linear optical methods uk_UA
dc.type Article uk_UA
dc.status published earlier uk_UA


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