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dc.contributor.author Kamuz, A.M.
dc.contributor.author Oleksenko, P.Ph.
dc.contributor.author Kamuz, O.A.
dc.contributor.author Kamuz, V.G.
dc.date.accessioned 2017-06-14T07:41:08Z
dc.date.available 2017-06-14T07:41:08Z
dc.date.issued 2002
dc.identifier.citation Method of low-temperature rise of laser diode quality / A.M. Kamuz, P.Ph. Oleksenko, O.A. Kamuz, V.G. Kamuz // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2002. — Т. 5, № 4. — С. 406-411. — Бібліогр.: 4 назв. — англ. uk_UA
dc.identifier.issn 1560-8034
dc.identifier.other PACS: 42.55.Px, 85.60.Jb
dc.identifier.uri http://dspace.nbuv.gov.ua/handle/123456789/121344
dc.description.abstract In 1987 the authors of this article discovered the effect of irreversible gigantic modification (IGM) of semiconductors. Basing on the IGM phenomenon the authors have developed technological method that enables to considerably improve performances of laser diodes after their manufacturing by increasing power, slope efficiency, and decreasing threshold current. The technology has been tested on the laser diodes of several US companies. We obtained the same results in improvement of all the diodes from these companies. Performances of the laser diodes with small slope efficiency and high threshold current were improved using this modification. Slope efficiency of laser diodes was increased by 2.3 or 3.7 times and the threshold current was decreased from 15 % up to 29 %. It is shown that modification depth of the semiconductor chip for these laser diodes exceeds 50 microns. Shown is that a beam divergence of laser diode can be decreased using the irreversible gigantic modification. uk_UA
dc.language.iso en uk_UA
dc.publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України uk_UA
dc.relation.ispartof Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title Method of low-temperature rise of laser diode quality uk_UA
dc.type Article uk_UA
dc.status published earlier uk_UA


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