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The theory of the line profile based on the absorption of X-ray diffraction and its experimental demonstration

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dc.contributor.author Liu Kejia
dc.contributor.author Xue Yin
dc.contributor.author Chen Kun
dc.date.accessioned 2017-06-12T12:22:34Z
dc.date.available 2017-06-12T12:22:34Z
dc.date.issued 2016
dc.identifier.citation The theory of the line profile based on the absorption of X-ray diffraction and its experimental demonstration / Liu Kejia, Xue Yin, Chen Kun // Functional Materials. — 2016. — Т. 23, № 2. — С. 212-217. — Бібліогр.: 5 назв. — англ. uk_UA
dc.identifier.issn 1027-5495
dc.identifier.other DOI: dx.doi.org/10.15407/fm23.02.212
dc.identifier.uri http://dspace.nbuv.gov.ua/handle/123456789/120613
dc.description.abstract We have studied the theory of the X-ray diffraction (XRD) absorption peak profile (Liu, K. et al., Adv X-ray Anal, 2010, 54, 17-23) in detail by further theoretical derivation and by verification of the experimental line profile of a standard sample. It was obtained that the deviation between theory and experiment is less than 9% for the standard samples, by ignoring the line profiles in the range of diffraction angle less than 60°, for which the instrumental broadening could not be ignored. And the theoretical formula between FWHM and the Bragg angle 2θ was derived which can be called as the ARF. The results show that the Caglioti's relations should be replaced by the formula derived in this work. uk_UA
dc.language.iso en uk_UA
dc.publisher НТК «Інститут монокристалів» НАН України uk_UA
dc.relation.ispartof Functional Materials
dc.subject Characterization and properties uk_UA
dc.title The theory of the line profile based on the absorption of X-ray diffraction and its experimental demonstration uk_UA
dc.type Article uk_UA
dc.status published earlier uk_UA


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