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Structural and microstructural properties of Cd₁-xZnxTe films deposited by close spaced vacuum sublimation

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dc.contributor.author Znamenshchykov, Y.V.
dc.contributor.author Kosyak, V.V.
dc.contributor.author Opanasyuk, A.S.
dc.contributor.author Kolesnyk, M.M.
dc.contributor.author Grinenko, V.V.
dc.contributor.author Fochuk, P.M.
dc.date.accessioned 2017-06-08T07:39:52Z
dc.date.available 2017-06-08T07:39:52Z
dc.date.issued 2016
dc.identifier.citation Structural and microstructural properties of Cd₁-xZnxTe films deposited by close spaced vacuum sublimation / Y.V. Znamenshchykov, V.V. Kosyak, A.S. Opanasyuk, M.M. Kolesnyk, V.V. Grinenko, P.M. Fochuk // Functional Materials. — 2016. — Т. 23, № 1. — С. 32-39. — Бібліогр.: 26 назв. — англ. uk_UA
dc.identifier.issn 1027-5495
dc.identifier.other DOI: dx.doi.org/10.15407/fm23.01.032
dc.identifier.uri http://dspace.nbuv.gov.ua/handle/123456789/119716
dc.description.abstract The structural properties (microstresses, texture, lattice parameter, coherent scattering domains size) and chemical composition of Cd₁₋xZnxTe (CZT) films with variable zinc concentration were studied. Films were deposited on molybdenum coated glass substrates by close spaced vacuum sublimation method. Properties of samples were investigated by X-ray diffraction, energy dispersive spectroscopy, scanning electron microscopy. Zinc concentration in CdZnTe layers was determined by the EDS and from the lattice parameter, according to the literature data. Namely, it was determined that the CZT films had following Zn concentrations: x = 0.09, x = 0.24, x = 0.30. uk_UA
dc.language.iso en uk_UA
dc.publisher НТК «Інститут монокристалів» НАН України uk_UA
dc.relation.ispartof Functional Materials
dc.subject Characterization and properties uk_UA
dc.title Structural and microstructural properties of Cd₁-xZnxTe films deposited by close spaced vacuum sublimation uk_UA
dc.type Article uk_UA
dc.status published earlier uk_UA


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