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XRD method for the determination of internal stresses in KDP crystals and their relationship to the anomalous biaxiality

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dc.contributor.author Puzikov, V.M.
dc.contributor.author Tkachenko, V.F.
dc.contributor.author Tsurikov, V.A.
dc.date.accessioned 2017-06-07T11:54:16Z
dc.date.available 2017-06-07T11:54:16Z
dc.date.issued 2015
dc.identifier.citation XRD method for the determination of internal stresses in KDP crystals and their relationship to the anomalous biaxiality / V.M. Puzikov, V.F. Tkachenko, V.A. Tsurikov // Functional Materials. — 2015. — Т. 22, № 3. — С. 402-407. — Бібліогр.: 17 назв. — англ. uk_UA
dc.identifier.issn 1027-5495
dc.identifier.other DOI: http://dx.doi.org/10.15407/fm22.03.402
dc.identifier.uri http://dspace.nbuv.gov.ua/handle/123456789/119559
dc.description.abstract Designed precision method for determining residual stresses in crystals of the KDP on the relative displacement of the rocking curves (RC), caused by the presence of tensile stress, compression from the {110} or {101}, with the asymmetric geometry of the shooting at the reflection. The error in determining the relative displacement of RC in this case is ±1 arcsec. The experimentally determined bias for RD crystals KDP, grown by different methods on samples cut from the prismatic and pyramidal growth sectors of the crystal. The relation between the value of the anomalous biaxiality 2V and a total displacement of RC due to the presence of internal tensile stress, compression in the crystal KDP. uk_UA
dc.language.iso en uk_UA
dc.publisher НТК «Інститут монокристалів» НАН України uk_UA
dc.relation.ispartof Functional Materials
dc.subject Devices and instruments uk_UA
dc.title XRD method for the determination of internal stresses in KDP crystals and their relationship to the anomalous biaxiality uk_UA
dc.type Article uk_UA
dc.status published earlier uk_UA


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