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dc.contributor.author Rozouvan, T.
dc.contributor.author Poperenko, L.
dc.contributor.author Shaykevich, I.
dc.contributor.author Rozouvan, S.
dc.date.accessioned 2017-06-07T11:43:09Z
dc.date.available 2017-06-07T11:43:09Z
dc.date.issued 2015
dc.identifier.citation Spatial resolution of scanning tunneling microscopy / T. Rozouvan, L. Poperenko, I. Shaykevich, S. Rozouvan // Functional Materials. — 2015. — Т. 22, № 3. — С. 365-369. — Бібліогр.: 17 назв. — англ. uk_UA
dc.identifier.issn 1027-5495
dc.identifier.other DOI: http://dx.doi.org/10.15407/fm22.03.365
dc.identifier.uri http://dspace.nbuv.gov.ua/handle/123456789/119552
dc.description.abstract Time-independent Schroedinger equation solution in paraxial approximation is obtained for de Broglie wave of electron. The solution results in exact ratios for spatial resolution of scanning tunneling microscopy (STM) of nanoobjects on a metal substrate. STM experiments on semiconductor and metal carbon nanotubes were performed in order to check the theoretical approach. The spatial resolution of the experiments reached 0.06 nm. Hexagonal structure on the semiconductor nanotube surface was registered. Relatively lower spatial resolution for the metal carbon nanotubes which is also different along and across nanotubes was registered and explained in frames of the proposed theoretical modeling. A basic ratio for STM spatial resolution for the arbitrary nanoobject was derived as a result of the approach. uk_UA
dc.language.iso en uk_UA
dc.publisher НТК «Інститут монокристалів» НАН України uk_UA
dc.relation.ispartof Functional Materials
dc.subject Modeling and simulation uk_UA
dc.title Spatial resolution of scanning tunneling microscopy uk_UA
dc.type Article uk_UA
dc.status published earlier uk_UA


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