Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions

dc.contributor.author	Ivanov, Z.G.
dc.contributor.author	Fogel, N.Ya.
dc.contributor.author	Yuzephovich, O.I.
dc.contributor.author	Stepantsov, E.A.
dc.contributor.author	Tzalenchuk, A.Ya.
dc.date.accessioned	2017-06-07T04:35:30Z
dc.date.available	2017-06-07T04:35:30Z
dc.date.issued	2004
dc.identifier.citation	Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇δ microbridges and bicrystal junctions / Z.G. Ivanov, N.Ya. Fogel, O.I. Yuzephovich, E.A. Stepantsov A.Ya. Tzalenchuk // Физика низких температур. — 2004. — Т. 30, № 3. — С. 276-281. — Бібліогр.: 12 назв. — англ.	uk_UA
dc.identifier.issn	0132-6414
dc.identifier.other	PACS: 74.60.Jg, 74.60.Ec, 74.72.Bk
dc.identifier.uri	http://dspace.nbuv.gov.ua/handle/123456789/119474
dc.description.abstract	We report on depairing critical currents in submicron YBa₂Cu₃O₇₋δ microbridges. A small-angle bicrystal grain boundary junction is used as a tool to study the entrance of vortices induced by a transport current and their influence on the I–V curves. The interplay between the depairing and the vortex motion determines a crossover in the temperature dependence of the critical current. The high entrance field of vortices in very narrow superconducting channels creates the possibility of carrying a critical current close to the depairing limit determined by the S–S–S nature of the small-angle grain boundary junction.	uk_UA
dc.description.sponsorship	Discussions with R.I. Shekhter and L.Yu. Gorelik are gratefully acknowledged. The project utilized the Swedish Nanometer Laboratory and was supported by the Materials consortium on superconductivity.	uk_UA
dc.language.iso	en	uk_UA
dc.publisher	Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України	uk_UA
dc.relation.ispartof	Физика низких температур
dc.subject	Свеpхпpоводимость, в том числе высокотемпеpатуpная	uk_UA
dc.title	Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions	uk_UA
dc.type	Article	uk_UA
dc.status	published earlier	uk_UA