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dc.contributor.author Tetyorkin, V.V.
dc.contributor.author Sukach, A.V.
dc.contributor.author Stariy, S.V.
dc.contributor.author Boiko, V.A.
dc.date.accessioned 2017-05-31T05:18:38Z
dc.date.available 2017-05-31T05:18:38Z
dc.date.issued 2012
dc.identifier.citation Photoluminescence studies of CdTe polycrystalline films / V.V. Tetyorkin, A.V. Sukach, S.V. Stariy and V.A. Boiko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 40-44. — Бібліогр.: 28 назв. — англ. uk_UA
dc.identifier.issn 1560-8034
dc.identifier.other PACS 78.55.E
dc.identifier.uri http://dspace.nbuv.gov.ua/handle/123456789/118723
dc.description.abstract Photoluminescence (PL) studies of CdTe polycrystalline films are reported. The films were grown using the modified close space sublimation technique on sapphire substrates. The mean grain size in the investigated films was ranged from 10 up to 360 μm. The distinct spectral bands around 1.580 and 1.440 eV were observed at 77 K. These bands are attributed to shallow bound excitons at dislocations and deep defects, respectively. The intensity of luminescence related to dislocation defects is found to be proportional to the density of grain boundaries. The nature of grain boundaries in the investigated films has been briefly discussed. uk_UA
dc.description.sponsorship This work is a part of the research work M310. The authors are grateful to our colleagues F. Sizov and G. Shepelskii for helpful discussions and technical support. uk_UA
dc.language.iso en uk_UA
dc.publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України uk_UA
dc.relation.ispartof Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title Photoluminescence studies of CdTe polycrystalline films uk_UA
dc.type Article uk_UA
dc.status published earlier uk_UA


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