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Occupation preference values in doped CmIm' multinaries from EXAFS and FTIR correlative analysis
Репозиторій DSpace/Manakin
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Occupation preference values in doped CmIm' multinaries from EXAFS and FTIR correlative analysis
Тема:
XVIII Уральская международная зимняя школа по физике полупроводников
Інший ID:
PACS: 74.70.Dd, 78.70.Dm, 87.64.km
Посилання:
Occupation preference values in doped CmIm' multinaries from EXAFS and FTIR correlative analysis / B.V. Robouch, A. Marcelli, P. Robouch, A. Kisiel // Физика низких температур. — 2011. — Т. 37, № 3. — С. 308–312. — Бібліогр.: 25 назв. — англ.
Підтримка:
The authors would like to thank A. Balerna for constructive comments. The work was partially supported by the European Community Research Infrastructure Integrating Activity “Study of Strongly Interacting Matter–Hadron Physics” (cf. contract number RII-CT-2004-506078) of the Sixth Framework Programme (FP6).
Дата:
2011
Переглядів:
822
Завантажень:
367
Анотація:
We discuss which x-ray absorption fine structure (EXAFS) data of binary doped CmIm' compound structures can be unfolded to determine elemental bond distances and the deviations from random configurations due to site preference occupations (SOPs). SOP-deviation estimations can be further confirmed by independent Fourier transform infrared (FTIR) data analysis. The limits and restrictions of our model are presented and discussed.
