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Thermal state modeling in thermosensitive elements of microelectronic devices with reach-through foreign inclusions

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dc.contributor.author Gavrysh, V.I.
dc.date.accessioned 2017-05-29T16:50:26Z
dc.date.available 2017-05-29T16:50:26Z
dc.date.issued 2012
dc.identifier.citation Thermal state modeling in thermosensitive elements of microelectronic devices with reach-through foreign inclusions / V.I Gavrysh.// Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 3. — С. 247-251. — Бібліогр.: 13 назв. — англ. uk_UA
dc.identifier.issn 1560-8034
dc.identifier.other PACS 74.25.fc
dc.identifier.uri http://dspace.nbuv.gov.ua/handle/123456789/118314
dc.description.abstract The nonlinear boundary axially symmetric problem of heat conduction for the thermosensitive piecewise homogeneous layer with reach-through cylindrical inclusion that generates heat has been considered. Using the introduced function, the partial linearization of the original problem has been carried out. With the proposed piecewiselinear approximation of temperature at the boundary surface of the foreign inclusion and on the contact surface of the homogeneous elements of the layer, the problem has been completely linearized. The analytical solution of this problem of finding the introduced function using Hankel integral transform has been formed. The formulae for calculating the desired temperature have been derived. uk_UA
dc.language.iso en uk_UA
dc.publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України uk_UA
dc.relation.ispartof Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title Thermal state modeling in thermosensitive elements of microelectronic devices with reach-through foreign inclusions uk_UA
dc.type Article uk_UA
dc.status published earlier uk_UA


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