Показати простий запис статті
dc.contributor.author |
Lysiuk, V.O. |
|
dc.contributor.author |
Staschuk, V.S. |
|
dc.contributor.author |
Kluy, M.I. |
|
dc.contributor.author |
Vakulenko, O.V. |
|
dc.contributor.author |
Poperenko, L.V. |
|
dc.date.accessioned |
2017-05-27T12:22:27Z |
|
dc.date.available |
2017-05-27T12:22:27Z |
|
dc.date.issued |
2007 |
|
dc.identifier.citation |
Influence of ion implantation on the near-surface structure of thin Ni and Pd films on lithium niobate and lithium tantalate / V.O. Lysiuk, V.S. Staschuk, M.I. Kluy, O.V. Vakulenko, L.V. Poperenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 2. — С. 76-80. — Бібліогр.: 13 назв. — англ. |
uk_UA |
dc.identifier.issn |
1560-8034 |
|
dc.identifier.other |
PACS 68.55.Ln, 85.60.Gz |
|
dc.identifier.uri |
http://dspace.nbuv.gov.ua/handle/123456789/117919 |
|
dc.description.abstract |
The systems “thin Ni film – lithium niobate” and “thin Pd film – lithium
tantalate” are implanted by Ar⁺ ions with an energy of 100 keV and a dose of 10¹⁶ cm⁻².
Analyses of the systems by AFM and SEM have shown that the ion implantation
essentially modifies the near-surface structure resulting in a change of its optical,
electrical, and mechanical properties. Strong difference in the near-surface structures
between implanted systems with Ni or Pd thin films is observed. Such a difference is
explained by the heterogeneity of an ion beam and different properties of the materials.
The application to the development of high-sensitive pyroelectric detectors with high
damage threshold is proposed. |
uk_UA |
dc.language.iso |
en |
uk_UA |
dc.publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
uk_UA |
dc.relation.ispartof |
Semiconductor Physics Quantum Electronics & Optoelectronics |
|
dc.title |
Influence of ion implantation on the near-surface structure of thin Ni and Pd films on lithium niobate and lithium tantalate |
uk_UA |
dc.type |
Article |
uk_UA |
dc.status |
published earlier |
uk_UA |
Файли у цій статті
Ця стаття з'являється у наступних колекціях
Показати простий запис статті