Перегляд за автором "Kyslovskyy, Ye.M."

Сортувати за: Порядок: Результатів:

  • Double- and triple-crystal X-ray diffractometry of microdefects in silicon 
    Molodkin, V.B.; Olikhovskii, S.I.; Kyslovskyy, Ye.M.; Len, E.G.; Reshetnyk, O.V.; Vladimirova, T.P.; V.V. Lizunov, V.V.; Lizunova, S.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2010)
    The generalized dynamical theory of X-ray scattering by real single crystals allows to self-consistently describe intensities of coherent and diffuse scattering measured by double- and triple-crystal diffractometers (DCD ...
  • Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals 
    Molodkin, V.B.; Olikhovskii, S.I.; Len, E.G.; Kyslovskyy, Ye.M.; Reshetnyk, O.V.; Vladimirova, T.P.; Sheludchenko, B.V.; Skakunova, E.S.; Lizunov, V.V.; Kochelab, E.V.; Fodchuk, I.M.; Klad’ko, V.P. (Металлофизика и новейшие технологии, 2016)
    A short review of basic principles and limitations in obtaining the analytical expressions for the coherent and diffuse scattering intensities measured by the triple-crystal diffractometer (TCD) are presented. Explicit ...