Перегляд за автором "Zuber, S."

Результати 1-3 з 3

Indium induced nanostructures on In₄Se₃(100) surface studied by scanning tunneling microscopy

Galiy, P.V.; Nenchuk, T.M.; Ciszewski, A.; Mazur, P.; Zuber, S.; Buzhuk, Ya.M. (Functional Materials, 2013)

Indium deposition leads to changes in the scanning tunneling microscopy (STM)-revealed (100) surface morphology of In₄Se₃ layered semiconductor with the formation of nanostructures, which are characterized by different ...
Investigation of (100) In₄Se₃ crystal surface nanorelief

Galiy, P.V.; Ciszewski, A.; Dveriy, O.R.; Losovyj, Ya.B.; Mazur, P.; Nenchuk, T.M.; Zuber, S.; Fiyala, Ya.M. (Functional Materials, 2009)

The crystallography and topography of the (100) cleavage surfaces of layered semiconductor In₄Se₃ crystal have been studied by low energy electron diffraction (LEED), scanning tunnelling and atomic-force microscopy (STM, ...
Scanning Tunneling Microscopy/Spectroscopy and Low-Energy Electron Diffraction Investigations of GaTe Layered Crystal Cleavage Surface

Galiy, P.; Nenchuk, T.; Ciszewski, A.; Mazur, P.; Zuber, S.; Yarovets, I. (Металлофизика и новейшие технологии, 2015)

Scanning tunnelling microscopy and spectroscopy (STM/STS) and low-energy electron diffraction (LEED) techniques are used in combination to study the surface structure of GaTe cleavages. Two different structures, hexagonal ...

Результати 1-3 з 3

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