Safriuk, N.V.; Stanchu, G.V.; Kuchuk, A.V.; Kladko, V.P.; Belyaev, A.E.; Machulin, V.F.
(Semiconductor Physics Quantum Electronics & Optoelectronics, 2013)
Methodical approaches to the analysis of X-ray data for GaN films grown on
various buffer layers and different substrates are presented in this work. Justification of
dislocation structure investigation by various methods ...