Перегляд за автором "Sarsembaeva, A.Z."

Результати 1-5 з 5

Determination of parameters of cadmium telluride films on silicon by the methods of main angle and multiangular ellipsometry

Odarych, V.A.; Sarsembaeva, A.Z.; Vuichyk, M.V.; Sizov, F.F. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2006)

The multiangular ellipsometric measurements were conducted at two wavelengths 435 and 579 nm on the system that contains cadmium telluride film deposited onto the monocrystalline silicon substrate. The refraction index and ...
Ellipsometric control of quality of polished MgF₂ optical ceramics

Maslov, V.P.; Sarsembaeva, A.Z.; Sizov, F.F. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2004)

In this work, ellipsometric measurements were used to optimise the technology of machine working the polished parts made of MgF₂ optical ceramics. The ellipsometry is a high-performance contactless method to control quality ...
Erratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials”

Maslov, V.P.; Sarsembaeva, A.Z.; Sizov, F.F. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2004)

The elastic deformation of thin mirrors is widely used in systems of adaptive optics, however, of influence of elastic deformations on parameters of reflected polarised light in the literature. Using the method of ...
Influence of elastic deformation on the residual ellipticity of polished optical materials

Maslov, V.P.; Sarsembaeva, A.Z.; Sizov, F.F. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2003)

The elastic deformation of thin mirrors is widely used in systems of adaptive optics, however, there are no data upon investigations of influence of elastic deformations on parameters of reflected polarised light in the ...
Investigation of cadmium telluride films on silicon substrate

Odarych, V.A.; Sarsembaeva, A.Z.; Sizov, F.F.; Vuichyk, M.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2005)

Properties of cadmium telluride films on silicon substrate, distribution of thickness and refraction index over the sample area were investigated by the ellipsometric method. It was ascertained that the refraction index ...

Результати 1-5 з 5

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Перегляд за автором "Sarsembaeva, A.Z."

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Перегляд за автором "Sarsembaeva, A.Z."

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