Litvinenko, V.N.; Vikulin, I.М.; Gorbachev, V.E.
(Технология и конструирование в электронной аппаратуре, 2019)
The paper considers the causes and mechanisms of the influence of defects and impurities on the reverse current of the Schottky diode. The influence of two getter regions, which were created by different technologies on ...