Перегляд за автором "Chumak, V.S."

Сортувати за: Порядок: Результатів:

  • Application of carbon as a barrier layer in Sc/Si multilayer X-ray mirrors 
    Pershyn, Yu.P.; Devizenko, I.Yu.; Chumak, V.S.; Devizenko, A.Yu.; Kondratenko, V.V. (Functional Materials, 2018)
    X-ray reflectometry in the hard X-ray region (λ = 0.154 nm) was used to investigate the barrier properties of carbon layers 0.2-1.3 nm thick in Sc/Si multilayer X-ray mirrors (MXMs) deposited by DC magnetron sputtering. ...
  • Growth and structure of WC/Si multilayer x-ray mirror 
    Pershyn, Y.P.; Chumak, V.S.; Shypkova, I.G.; Mamon, V.V.; Devizenko, A.Yu.; Kondratenko, V.V.; Reshetnyak, M.V.; Zubarev, E.N. (Вопросы атомной науки и техники, 2018)
    WC/Si multilayer X-ray mirrors (MXMs) with nominal layers thicknesses of 0.2…30.3 nm (periods: 0.7…38.9 nm) were deposited by direct current magnetron sputtering and studied by X-ray diffraction and cross-sectional ...