Gann, V.V.; den Hartog, H.W.; Vainshtein, D.I.
(Вопросы атомной науки и техники, 2004)
We have proposed a new model for the calculation of the absorbed dose profile in a thick target under 0.1…3 MeV electron
irradiation. The build-up phenomenon is shown to increase the maximum of the energy deposition profile ...