Перегляд Semiconductor Physics Quantum Electronics & Optoelectronics за автором "Vuichyk, M.V."

Результати 1-3 з 3

Determination of parameters of cadmium telluride films on silicon by the methods of main angle and multiangular ellipsometry

Odarych, V.A.; Sarsembaeva, A.Z.; Vuichyk, M.V.; Sizov, F.F. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2006)

The multiangular ellipsometric measurements were conducted at two wavelengths 435 and 579 nm on the system that contains cadmium telluride film deposited onto the monocrystalline silicon substrate. The refraction index and ...
Investigation of cadmium telluride films on silicon substrate

Odarych, V.A.; Sarsembaeva, A.Z.; Sizov, F.F.; Vuichyk, M.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2005)

Properties of cadmium telluride films on silicon substrate, distribution of thickness and refraction index over the sample area were investigated by the ellipsometric method. It was ascertained that the refraction index ...
Morphologic and optical characterization of ZnO:Co thin films grown by PLD

Vuichyk, M.V.; Tsybrii, Z.F.; Lavoryk, S.R.; Svezhentsova, K.V.; Virt, I.S.; Chizhov, A. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2014)

The morphological properties of the surface and optical characteristics of nanocomposite ZnO:Co structures grown on substrates of monocrystalline silicon and sapphire by pulsed laser deposition (PLD) method have been ...

Результати 1-3 з 3

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