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Перегляд Semiconductor Physics Quantum Electronics & Optoelectronics за автором "Kurashov, V.N."

Репозиторій DSpace/Manakin

Перегляд Semiconductor Physics Quantum Electronics & Optoelectronics за автором "Kurashov, V.N."

Сортувати за: Порядок: Результатів:

  • Combined Fourier hologram as a noise-resist method of synthesis 2D computer-generated hologram with single diffractive order 
    Braginets, E.V.; Girnyk, V.I.; Kostyukevich, S.A.; Kurashov, V.N.; Bushma, A.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2008)
    In this paper, a comparative analysis of two approaches to synthesis 2D hologram, which restores optical field without conjugated images, is performed. These holograms are used in embossed rainbow protective holograms ...
  • Determination of surface defects by using the wavefront scanner 
    Goloborodko, N.S.; Grygoruk, V.I.; Kurashov, V.N.; Podanchuk, D.V.; Goloborodko, A.A.; Kotov, M.M. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2010)
    The possibility of changes in the polarization state of the laser beam reflected from inhomogeneity with the refractive index gradient is theoretically shown, which allows separating the phase shifts related with relief ...
  • Kinoform syntesis as an improved method to form a concealed image in optical security devices 
    Braginets, E.V.; Girnyk, V.I.; Kostyukevych, S.A.; Kurashov, V.N.; Soroka, A.A.; Moskalenko, N. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2006)
    It is well known that one of the basic functions of security holograms is the maximal complication of their non-authorized reproduction, in other words – counterfeiting. To solve the problem, concealed images that can be ...
  • Shack-hartmann wavefront sensor with holographic lenslet array for the aberration measurements in a speckle field 
    Podanchuk, D.V.; Kurashov, V.N.; Dan’ko, V.P.; Kotov, M.M.; Sutyagina, N.S. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2008)
    The application of a Shack-Hartmann sensor with holographic lenslet array to the measurements of wavefront aberrations in a speckle field is offered. The main feature of the method is that the tested wave front can be ...
  • Speckle pattern formation in spatially limited optical systems 
    Kotov, M.M.; Kurashov, V.N.; Goloborodko, A.A. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2016)
    The dependences of statistical parameters inherent to speckle patterns on the object roughness and aperture size have been investigated. The experimental results that confirm theoretical dependence quality within the limits ...

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