Silicon crystal strength reduction due to magnetoresonance

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Відділення фізико-технічних проблем матеріалознавства
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Functional Materials
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Functional Materials, 2007, том 14
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Functional Materials, 2007, № 2
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dc.contributor.author	Makara, V.A.
dc.contributor.author	Pogorilyi, A.M.
dc.contributor.author	Steblenko, L.P.
dc.contributor.author	Kuryliuk, A.M.
dc.contributor.author	Naumenko, S.M.
dc.contributor.author	Kobzar, Yu.L.
dc.contributor.author	Kravets, A.F.
dc.contributor.author	Podyalovsky, D.I.
dc.contributor.author	Matveeva, O.V.
dc.date.accessioned	2018-06-16T13:06:25Z
dc.date.available	2018-06-16T13:06:25Z
dc.date.issued	2007
dc.identifier.citation	Silicon crystal strength reduction due to magnetoresonance / V.A. Makara, A.M. Pogorilyi, L.P. Steblenko, A.M. Kuryliuk, S.M. Naumenko, Yu.L. Kobzar, A.F. Kravets, D.I. Podyalovsky, O.V. Matveeva // Functional Materials. — 2007. — Т. 14, № 2. — С. 192-194. — Бібліогр.: 8 назв. — англ.	uk_UA
dc.identifier.issn	1027-5495
dc.identifier.uri	http://dspace.nbuv.gov.ua/handle/123456789/136494
dc.description.abstract	The magnetoresonance influence as well as the micrawave superhigh-frequency (SHF) magnetic field effect on the microhardness of silicon crystals has been studied. It is established that the action of SHF field results in decreasing microhardness, which does not relax for initial value during a long time (50 days). A mechanism has been suggested for the revealed effects.	uk_UA
dc.language.iso	en	uk_UA
dc.publisher	НТК «Інститут монокристалів» НАН України	uk_UA
dc.relation.ispartof	Functional Materials
dc.title	Silicon crystal strength reduction due to magnetoresonance	uk_UA
dc.title.alternative	Магніторезонансне знеміцнення кристалів кремнію	uk_UA
dc.type	Article	uk_UA
dc.status	published earlier	uk_UA