Наукова електронна бібліотека
періодичних видань НАН України
періодичних видань НАН України
Structure and stress state of ion-plasma hafnium condensates
Репозиторій DSpace/Manakin
JavaScript is disabled for your browser. Some features of this site may not work without it.
| dc.contributor.author | Vus, A.S. | |
| dc.contributor.author | Malykhin, S.V. | |
| dc.contributor.author | Pugachev, A.T. | |
| dc.contributor.author | Reshetnyak, E.N. | |
| dc.contributor.author | Azhazha, R.V. | |
| dc.contributor.author | Kovtun, K.V. | |
| dc.date.accessioned | 2018-06-16T13:04:54Z | |
| dc.date.available | 2018-06-16T13:04:54Z | |
| dc.date.issued | 2007 | |
| dc.identifier.citation | Structure and stress state of ion-plasma hafnium condensates / A.S. Vus, S.V. Malykhin, A.T. Pugachev, E.N. Reshetnyak, R.V. Azhazha, K.V. Kovtun // Functional Materials. — 2007. — Т. 14, № 2. — С. 204-208. — Бібліогр.: 11 назв. — англ. | uk_UA |
| dc.identifier.issn | 1027-5495 | |
| dc.identifier.uri | http://dspace.nbuv.gov.ua/handle/123456789/136491 | |
| dc.description.abstract | The 0.05-0.5 μm trick films have been obtained from GFE-1 grade hafnium target by magnetron sputtering using argon ions. Purity of the obtained films was controlled by X-ray fluorescence spectroscopy. The structure of films was explored by X-ray diffractometry. The compression residual stresses in the α-Hf films and the value of crystal lattice periods have been determined by X-ray strain measurement. | uk_UA |
| dc.language.iso | en | uk_UA |
| dc.publisher | НТК «Інститут монокристалів» НАН України | uk_UA |
| dc.relation.ispartof | Functional Materials | |
| dc.title | Structure and stress state of ion-plasma hafnium condensates | uk_UA |
| dc.title.alternative | Структура та напружений стан іонно-плазмових конденсатів гафнію | uk_UA |
| dc.type | Article | uk_UA |
| dc.status | published earlier | uk_UA |
