Tkachenko, V.F.; Puzikov, V.M.; Dan`ko, A.Ya.; Budnikov, A.T.; Lukienko, O.A.
(Functional Materials, 2007)
Triple-crystal X-ray diffractometry has been used to study the structure perfection in bulk and surface layer of basal-oriented sapphire single crystals grown using horizontal directional crystallization (HDC) in reducing ...