Mikhailov, I.F.; Malykhin, S.V.; Borisova, S.S.; Fomina, L.P.
(Functional Materials, 2006)
Using X-ray reflectometry method, the kinektics of solid state reactions at the surface of layered thin film nickel/Sisub system (effective nickel thickness 15 and 45 nm) under VUV irradiation of 8≤hv≤1.8 eV energy was ...