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Classic Ronchi test and its variants for quality control of various optical surfaces

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dc.contributor.author Malenko, A.S.
dc.contributor.author Borovytsky, V.N.
dc.date.accessioned 2017-06-14T18:38:19Z
dc.date.available 2017-06-14T18:38:19Z
dc.date.issued 2016
dc.identifier.citation Classic Ronchi test and its variants for quality control of various optical surfaces / A.S. Malenko, V.N. Borovytsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 311-314. — Бібліогр.: 13 назв. — англ. uk_UA
dc.identifier.issn 1560-8034
dc.identifier.other DOI: 10.15407/spqeo19.03.311
dc.identifier.other PACS 42.15.Fr
dc.identifier.uri http://dspace.nbuv.gov.ua/handle/123456789/121606
dc.description.abstract Performed in this work is the analysis of the optical Ronchi interferometer circuit and its upgrading to test quality of various optical surfaces. Briefly described in this paper is the classic test by Ronchi, shown is every upgraded circuit diagram of the interferometer and their principle of operation. Also, it is demonstrated interferential patterns for each method allowing one to determine which aberrations are present in the tested optics. With this method, when one can only visually detect aberrations, it seems to be not accurate. But with digital image processing the interferential pattern, special mathematical models and algorithms, aberrations that are present in the optical surface can be calculated with very high accuracy. Therefore, the methods of control offered in this paper provide fast and accurate results for the data circuits to be simply assembled and configured. uk_UA
dc.language.iso en uk_UA
dc.publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України uk_UA
dc.relation.ispartof Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title Classic Ronchi test and its variants for quality control of various optical surfaces uk_UA
dc.type Article uk_UA
dc.status published earlier uk_UA


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