Degradation processes in LED modules

dc.contributor.author	Sorokin, V.M.
dc.contributor.author	Kudryk, Ya.Ya.
dc.contributor.author	Shynkarenko, V.V.
dc.contributor.author	Kudryk, R.Ya.
dc.contributor.author	Sai, P.O.
dc.date.accessioned	2017-06-14T17:19:46Z
dc.date.available	2017-06-14T17:19:46Z
dc.date.issued	2016
dc.identifier.citation	Degradation processes in LED modules / V.M. Sorokin, Ya.Ya. Kudryk, V.V. Shynkarenko, R.Ya. Kudryk, P.O. Sai // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 248-254. — Бібліогр.: 5 назв. — англ.	uk_UA
dc.identifier.issn	1560-8034
dc.identifier.other	DOI: 10.15407/spqeo19.03.248
dc.identifier.other	PACS 44.05.+e, 02.70.Rr, 42.72.-g
dc.identifier.uri	http://dspace.nbuv.gov.ua/handle/123456789/121585
dc.description.abstract	Electrical-heat-light degradation model of a light-emitting module has been developed in this work. The Monte-Carlo method was used to calculate the reliability time of LED modules with different halfwidth of LED chip series resistance. Separation of LED chips with different series resistance before assembling may increase the time of emission in a stable mode up to 10%.	uk_UA
dc.language.iso	en	uk_UA
dc.publisher	Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України	uk_UA
dc.relation.ispartof	Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title	Degradation processes in LED modules	uk_UA
dc.type	Article	uk_UA
dc.status	published earlier	uk_UA