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dc.contributor.author |
Gritsenko, M.I. |
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dc.contributor.author |
Kucheev, S.I. |
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dc.contributor.author |
Lytvyn, P.M. |
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dc.contributor.author |
Tishenko, V.G. |
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dc.contributor.author |
Tkach, V.M. |
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dc.contributor.author |
Yelshansky, V.B. |
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dc.date.accessioned |
2017-06-14T10:54:40Z |
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dc.date.available |
2017-06-14T10:54:40Z |
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dc.date.issued |
2006 |
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dc.identifier.citation |
Micropatterning in bistable cholesteric device with Bragg's reflection / M.I. Gritsenko, S.I. Kucheev, P.M. Lytvyn, V.G. Tishenko, V.M. Tkach, V.B. Yelshansky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 2. — С. 61-64. — Бібліогр.: 14 назв. — англ. |
uk_UA |
dc.identifier.issn |
1560-8034 |
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dc.identifier.other |
PACS 42.79.Kr, 89.75 Kd |
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dc.identifier.uri |
http://dspace.nbuv.gov.ua/handle/123456789/121435 |
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dc.description.abstract |
In this work, the method to form bistable patterning in a cholesteric cell with Bragg’s reflection in the visible spectral range is demonstrated. In order to reach this, we used a Si/SiO₂ structure in which a potential relief on SiO₂ surface is induced due to enrichment and depletion of required form areas of the silicon near-surface layer during external electric field action. The patterning of enrichment is determined by the positive charge embedded into SiO₂ film, which is formed by thermodiffusion of aluminum atoms. |
uk_UA |
dc.language.iso |
en |
uk_UA |
dc.publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
uk_UA |
dc.relation.ispartof |
Semiconductor Physics Quantum Electronics & Optoelectronics |
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dc.title |
Micropatterning in bistable cholesteric device with Bragg's reflection |
uk_UA |
dc.type |
Article |
uk_UA |
dc.status |
published earlier |
uk_UA |
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