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dc.contributor.author Kovalenko, S.A.
dc.date.accessioned 2017-06-13T16:54:49Z
dc.date.available 2017-06-13T16:54:49Z
dc.date.issued 2000
dc.identifier.citation Dimensional effects in thin gold films / S.A. Kovalenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 4. — С. 514-519. — Бібліогр.: 21 назв. — англ. uk_UA
dc.identifier.issn 1560-8034
dc.identifier.other PACS: 78.20.C, 78.66
dc.identifier.uri http://dspace.nbuv.gov.ua/handle/123456789/121215
dc.description.abstract Research results of optical constants of thin gold films of different thickness are given in the paper. Their structure was studied using atomic-force microscope. Values of refraction n and absorption k coefficients were calculated from reflection and transmission spectra by traditional ratios, and using new theory as well. Comparison of results obtained by both methods was carried out and possible causes of divergences were pointed out. uk_UA
dc.description.sponsorship The author thanks Dr. P.E. Shepeliavyi for manufac-turing samples of high quality, Prof. I.Z. Indutnyy for his aid in organizing the experiment, and Academician M.P. Lisitsa for valuable recommendations and continu-ous interest to the work. uk_UA
dc.language.iso en uk_UA
dc.publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України uk_UA
dc.relation.ispartof Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title Dimensional effects in thin gold films uk_UA
dc.type Article uk_UA
dc.status published earlier uk_UA


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