Residual error after non-uniformity correction

dc.contributor.author	Borovytsky, V.N.
dc.date.accessioned	2017-06-11T13:14:06Z
dc.date.available	2017-06-11T13:14:06Z
dc.date.issued	2000
dc.identifier.citation	Residual error after non-uniformity correction / V.N. Borovytsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 1. — С. 102-105. — Бібліогр.: 4 назв. — англ.	uk_UA
dc.identifier.issn	1560-8034
dc.identifier.other	PACS 07.07.D,42.79.P,Q
dc.identifier.uri	http://dspace.nbuv.gov.ua/handle/123456789/120229
dc.description.abstract	The paper represents the technique for residual error evaluation after two-points linear non-uniformity correction. This technique takes into consideration parameters of an imaging system, reference sources, non-linearity and noise of a focal plane array.	uk_UA
dc.language.iso	en	uk_UA
dc.publisher	Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України	uk_UA
dc.relation.ispartof	Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title	Residual error after non-uniformity correction	uk_UA
dc.type	Article	uk_UA
dc.status	published earlier	uk_UA