High-stable standard samples of mass in the nano-gram range

Домашня сторінка
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Фізико-технічні та математичні науки
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Відділення фізико-технічних проблем матеріалознавства
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Functional Materials
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Functional Materials, 2013, том 20
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Functional Materials, 2013, № 2
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dc.contributor.author	Mikhailov, I.F.
dc.contributor.author	Baturin, A.A.
dc.contributor.author	Bugaev, Ye.A.
dc.contributor.author	Mikhailov, A.I.
dc.contributor.author	Borisova, S.S.
dc.date.accessioned	2017-06-11T05:46:35Z
dc.date.available	2017-06-11T05:46:35Z
dc.date.issued	2013
dc.identifier.citation	High-stable standard samples of mass in the nano-gram range / I.F. Mikhailov, A.A. Baturin, Ye.A. Bugaev, A.I. Mikhailov, S.S. Borisova // Functional Materials. — 2013. — Т. 20, № 2. — С. 266-271. — Бібліогр.: 9 назв. — англ.	uk_UA
dc.identifier.issn	1027-5495
dc.identifier.other	DOI: dx.doi.org/10.15407/fm20.02.266
dc.identifier.uri	http://dspace.nbuv.gov.ua/handle/123456789/120075
dc.description.abstract	High-stable mass standards prepared as magnetron sputtered super-smooth metal layers deposited on single crystal substrates were attested. The thin film standards were found to meet the requirements to government standards: they are homogeneous, long-lived, and can be attested by several independent methods. Using the standards, the measurement accuracy is provided not worse than 1 ng in the range from 1 to 17 ng, and not worse than 8 ng in the range from 17 to 3800 ng.	uk_UA
dc.language.iso	en	uk_UA
dc.publisher	НТК «Інститут монокристалів» НАН України	uk_UA
dc.relation.ispartof	Functional Materials
dc.subject	Devices and instruments	uk_UA
dc.title	High-stable standard samples of mass in the nano-gram range	uk_UA
dc.type	Article	uk_UA
dc.status	published earlier	uk_UA