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dc.contributor.author |
Kovalenko, S.A. |
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dc.date.accessioned |
2017-06-10T08:12:12Z |
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dc.date.available |
2017-06-10T08:12:12Z |
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dc.date.issued |
1999 |
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dc.identifier.citation |
Optical properties of thin metal films / S.A. Kovalenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 3. — С. 13-20. — Бібліогр.: 25 назв. — англ. |
uk_UA |
dc.identifier.issn |
1560-8034 |
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dc.identifier.other |
PACS: 78.66; 78.20.C |
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dc.identifier.uri |
http://dspace.nbuv.gov.ua/handle/123456789/119882 |
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dc.description.abstract |
Optical constants of metallic thin films made from: Ag, Au, Hf, Ir, Mo, Nb, Os, Pd, Pt, Re, Rh, Ru, Ta, W, Zr were determined on the basis of measured index of refraction in region of wavelength λ = 241216 Å. Two types of relations were used for the calculation. Some of them were obtained, with taking into account that refractive index of absorbing medium can be presented in the form ñ = n ± iæ. Other were obtained from Maxwell boundary condition. Both approaches give rise to very close results for æ, however the dependences n = f(λ) for λ > 200 Å are essentially different. The reasons of such differences are discussed. |
uk_UA |
dc.description.sponsorship |
The author would like to emphasize his gratitude to Academician M.P. Lisitsa who is the supervisor and the author of the main idea of this work. |
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dc.language.iso |
en |
uk_UA |
dc.publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
uk_UA |
dc.relation.ispartof |
Semiconductor Physics Quantum Electronics & Optoelectronics |
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dc.title |
Optical properties of thin metal films |
uk_UA |
dc.type |
Article |
uk_UA |
dc.status |
published earlier |
uk_UA |
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