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Investigation of the photoelastic effect in si at high values of the absorptivity

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dc.contributor.author Boiko, I.I.
dc.contributor.author Venger, Ye.F.
dc.contributor.author Nikitenko, E.V.
dc.contributor.author Serdega, B.K.
dc.date.accessioned 2017-06-10T07:45:35Z
dc.date.available 2017-06-10T07:45:35Z
dc.date.issued 1999
dc.identifier.citation Investigation of the photoelastic effect in si at high values of the absorptivity / I.I. Boiko, Ye.F. Venger, E.V. Nikitenko, B.K. Serdega // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 2. — С. 54-58. — Бібліогр.: 8 назв. — англ. uk_UA
dc.identifier.issn 1560-8034
dc.identifier.other PACS 78.20.C
dc.identifier.uri http://dspace.nbuv.gov.ua/handle/123456789/119860
dc.description.abstract The birefrigence effect induced by uniaxial elastic deformation has been investigated in monocrystalline Si using theoretical and experimental technigues. To improve a measuring system sensitivity in the range of band absorption, polarization modulation of reffected emission was used. Deformation characteristics of this effect has been measured. The main results obtained for probing light wavelengths from the range of crystal transparency are in a good accordance with conclusions of previons studies. In the range of strong absorption, a considerable change of effect characteristic shapes was found, and their satisfactory accordance with results of theoretical estimations was also ascertained. uk_UA
dc.language.iso en uk_UA
dc.publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України uk_UA
dc.relation.ispartof Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title Investigation of the photoelastic effect in si at high values of the absorptivity uk_UA
dc.type Article uk_UA
dc.status published earlier uk_UA


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