Показати простий запис статті
dc.contributor.author |
Boiko, I.I. |
|
dc.contributor.author |
Venger, Ye.F. |
|
dc.contributor.author |
Nikitenko, E.V. |
|
dc.contributor.author |
Serdega, B.K. |
|
dc.date.accessioned |
2017-06-10T07:45:35Z |
|
dc.date.available |
2017-06-10T07:45:35Z |
|
dc.date.issued |
1999 |
|
dc.identifier.citation |
Investigation of the photoelastic effect in si at high values of the absorptivity / I.I. Boiko, Ye.F. Venger, E.V. Nikitenko, B.K. Serdega // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 2. — С. 54-58. — Бібліогр.: 8 назв. — англ. |
uk_UA |
dc.identifier.issn |
1560-8034 |
|
dc.identifier.other |
PACS 78.20.C |
|
dc.identifier.uri |
http://dspace.nbuv.gov.ua/handle/123456789/119860 |
|
dc.description.abstract |
The birefrigence effect induced by uniaxial elastic deformation has been investigated in monocrystalline Si using theoretical and experimental technigues. To improve a measuring system sensitivity in the range of band absorption, polarization modulation of reffected emission was used. Deformation characteristics of this effect has been measured. The main results obtained for probing light wavelengths from the range of crystal transparency are in a good accordance with conclusions of previons studies. In the range of strong absorption, a considerable change of effect characteristic shapes was found, and their satisfactory accordance with results of theoretical estimations was also ascertained. |
uk_UA |
dc.language.iso |
en |
uk_UA |
dc.publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
uk_UA |
dc.relation.ispartof |
Semiconductor Physics Quantum Electronics & Optoelectronics |
|
dc.title |
Investigation of the photoelastic effect in si at high values of the absorptivity |
uk_UA |
dc.type |
Article |
uk_UA |
dc.status |
published earlier |
uk_UA |
Файли у цій статті
Ця стаття з'являється у наступних колекціях
Показати простий запис статті