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dc.contributor.author |
Savenkov, S.N. |
|
dc.contributor.author |
Oberemok, Ye.A. |
|
dc.contributor.author |
Klimov, O.S. |
|
dc.contributor.author |
Barchuk, О.I. |
|
dc.date.accessioned |
2017-05-31T19:46:09Z |
|
dc.date.available |
2017-05-31T19:46:09Z |
|
dc.date.issued |
2009 |
|
dc.identifier.citation |
Effect of the structure of polarimeter characteristic matrix
on light polarization measurements / S.N. Savenkov, Ye.A. Oberemok, O.S. Klimov, О.I. Barchuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 3. — С.264-271. — Бібліогр.: 26 назв. — англ. |
uk_UA |
dc.identifier.issn |
1560-8034 |
|
dc.identifier.other |
PACS 07.60.Fs |
|
dc.identifier.uri |
http://dspace.nbuv.gov.ua/handle/123456789/118872 |
|
dc.description.abstract |
In the paper, we carried out the comparative analysis of three polarimeters
among the most usable their variants: (i) Stokes polarimeter based on phenomenological
definition of Stokes parameters; (ii) Stokes polarimeter based on the method of four
intensities; (iii) Stokes dynamic polarimeter. We show that, since the accuracy in
determination of individual Stokes parameter is different for different types of
polarimeters, and, therewith, it depends on polarization of input light. All that strongly
motivates the choice of type of polarimeter to provide minimum errors in determination
of polarization parameters (ellipticity angle ε, azimuth β, and degree of polarization P). |
uk_UA |
dc.language.iso |
en |
uk_UA |
dc.publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
uk_UA |
dc.relation.ispartof |
Semiconductor Physics Quantum Electronics & Optoelectronics |
|
dc.title |
Effect of the structure of polarimeter characteristic matrix on light polarization measurements |
uk_UA |
dc.type |
Article |
uk_UA |
dc.status |
published earlier |
uk_UA |
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