Occupation preference values in doped CmIm' multinaries from EXAFS and FTIR correlative analysis

dc.contributor.author	Robouch, B.V.
dc.contributor.author	Marcelli, A.
dc.contributor.author	Robouch, P.
dc.contributor.author	Kisiel, A.
dc.date.accessioned	2017-05-30T14:57:21Z
dc.date.available	2017-05-30T14:57:21Z
dc.date.issued	2011
dc.identifier.citation	Occupation preference values in doped CmIm' multinaries from EXAFS and FTIR correlative analysis / B.V. Robouch, A. Marcelli, P. Robouch, A. Kisiel // Физика низких температур. — 2011. — Т. 37, № 3. — С. 308–312. — Бібліогр.: 25 назв. — англ.	uk_UA
dc.identifier.issn	0132-6414
dc.identifier.other	PACS: 74.70.Dd, 78.70.Dm, 87.64.km
dc.identifier.uri	http://dspace.nbuv.gov.ua/handle/123456789/118525
dc.description.abstract	We discuss which x-ray absorption fine structure (EXAFS) data of binary doped CmIm' compound structures can be unfolded to determine elemental bond distances and the deviations from random configurations due to site preference occupations (SOPs). SOP-deviation estimations can be further confirmed by independent Fourier transform infrared (FTIR) data analysis. The limits and restrictions of our model are presented and discussed.	uk_UA
dc.description.sponsorship	The authors would like to thank A. Balerna for constructive comments. The work was partially supported by the European Community Research Infrastructure Integrating Activity “Study of Strongly Interacting Matter–Hadron Physics” (cf. contract number RII-CT-2004-506078) of the Sixth Framework Programme (FP6).	uk_UA
dc.language.iso	en	uk_UA
dc.publisher	Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України	uk_UA
dc.relation.ispartof	Физика низких температур
dc.subject	XVIII Уральская международная зимняя школа по физике полупроводников	uk_UA
dc.title	Occupation preference values in doped CmIm' multinaries from EXAFS and FTIR correlative analysis	uk_UA
dc.type	Article	uk_UA
dc.status	published earlier	uk_UA