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dc.contributor.author |
Dmitruk, N.L. |
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dc.contributor.author |
Borkovskaya, O.Yu. |
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dc.contributor.author |
Naumenko, D.O. |
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dc.contributor.author |
Havrylenko, T.S. |
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dc.contributor.author |
Basiuk, E. |
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dc.contributor.author |
Shpilevsky, E.M. |
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dc.date.accessioned |
2017-05-29T14:41:48Z |
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dc.date.available |
2017-05-29T14:41:48Z |
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dc.date.issued |
2012 |
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dc.identifier.citation |
Effect of nanosize metal overlayer on C₆₀ thin film optical parameters near fundamental absorption edge / N.L. Dmitruk, O.Yu. Borkovskaya, D.O. Naumenko, T.S. Havrylenko, E. Basiuk, E.M. Shpilevsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 1. — С. 61-64. — Бібліогр.: 8 назв. — англ. |
uk_UA |
dc.identifier.issn |
1560-8034 |
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dc.identifier.other |
PACS 78.40.Ri, 78.67.Bf |
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dc.identifier.uri |
http://dspace.nbuv.gov.ua/handle/123456789/118275 |
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dc.description.abstract |
The effect of nanosize metal overlayer, both evaporated on C₆₀ films (Bi, In) and attached as nanoparticles of (Ag, Au), on the optical parameters of C₆₀ films near the fundamental absorption edge has been studied. The values of direct band gap (Eg), the optical gap (E₀) in the framework of Tauc model and the Urbach tail parameter (EU) were determined from the absorption coefficient (α) spectra plotted in coordinates (αhν)², (αhν)¹/² ln(α) vs hν, respectively. Parameters obtained testify diminishing the structural disorder in C₆₀ thin films with nanosize metal overlayer at optimal ratio of C₆₀ to metal layer thicknesses. |
uk_UA |
dc.language.iso |
en |
uk_UA |
dc.publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
uk_UA |
dc.relation.ispartof |
Semiconductor Physics Quantum Electronics & Optoelectronics |
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dc.title |
Effect of nanosize metal overlayer on C₆₀ thin film optical parameters near fundamental absorption edge |
uk_UA |
dc.type |
Article |
uk_UA |
dc.status |
published earlier |
uk_UA |
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