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dc.contributor.author |
Borblik, V.L. |
|
dc.contributor.author |
Shwarts, Yu.M. |
|
dc.contributor.author |
Shwarts, M.M. |
|
dc.date.accessioned |
2017-05-28T17:55:15Z |
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dc.date.available |
2017-05-28T17:55:15Z |
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dc.date.issued |
2007 |
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dc.identifier.citation |
Characteristics of diode temperature sensors which exhibit Mott conduction in low temperature region / V.L. Borblik, Yu.M. Shwarts, M.M. Shwarts // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 3. — С. 44-47. — Бібліогр.: 11 назв. — англ. |
uk_UA |
dc.identifier.issn |
1560-8034 |
|
dc.identifier.other |
PACS 07.07.Df, 61.72.Tt, 72.20.-I, 85.30.Kk |
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dc.identifier.uri |
http://dspace.nbuv.gov.ua/handle/123456789/118120 |
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dc.description.abstract |
Heavily doped silicon diodes of n⁺⁺-p⁺ type which exhibit the Mott
temperature dependence of the forward current in a certain range of bias voltages and
low temperatures have studied from the point of their use as temperature sensors. In the
region of hopping conduction, the operating signal of diodes U (T) (U is a voltage drop
across the diode during the passage of a constant current, T is the temperature)
reproduces the Mott law (with opposite sign in the exponent), and the temperature
sensitivity of such sensors after passing through a minimum (as the temperature is
lowered) increases again up to the values typical of room temperature |
uk_UA |
dc.language.iso |
en |
uk_UA |
dc.publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
uk_UA |
dc.relation.ispartof |
Semiconductor Physics Quantum Electronics & Optoelectronics |
|
dc.title |
Characteristics of diode temperature sensors which exhibit Mott conduction in low temperature region |
uk_UA |
dc.type |
Article |
uk_UA |
dc.status |
published earlier |
uk_UA |
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