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dc.contributor.author |
Valakh, M.Ya. |
|
dc.contributor.author |
Strelchuk, V.V. |
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dc.contributor.author |
Kolomys, O.F. |
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dc.contributor.author |
Hartnagel, H.L. |
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dc.contributor.author |
Sigmund, J. |
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dc.date.accessioned |
2017-05-28T09:02:53Z |
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dc.date.available |
2017-05-28T09:02:53Z |
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dc.date.issued |
2003 |
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dc.identifier.citation |
Resonance Raman scattering by intersubband plasmon-phonon excitations in InAs/AlSb structures / M.Ya. Valakh, V.V. Strelchuk, O.F. Kolomys, H.L. Hartnagel, J. Sigmund // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 287-293. — Бібліогр.: 34 назв. — англ. |
uk_UA |
dc.identifier.issn |
1560-8034 |
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dc.identifier.other |
PACS: 63.22.+m, 72.10.Di, 78.30.-j |
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dc.identifier.uri |
http://dspace.nbuv.gov.ua/handle/123456789/118031 |
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dc.description.abstract |
Intersubband plasmon-phonon excitations in InAs/AlSb with InSb- and AlAs-like interfaces were studied using the Raman scattering method. It was found that InSb interface is characterized by a decreasing concentration and increasing mobility of 2D electrons in InAs quantum wells. In the case of AlAs interface at the heterojunction quantum well - barrier, the formation of AlSb₁₋xAsx solid solution takes place. Revealed are considerable concentration changes for 2D electrons at low temperatures in dependency on the excitation quantum energy. |
uk_UA |
dc.language.iso |
en |
uk_UA |
dc.publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
uk_UA |
dc.relation.ispartof |
Semiconductor Physics Quantum Electronics & Optoelectronics |
|
dc.title |
Resonance Raman scattering by intersubband plasmon-phonon excitations in InAs/AlSb structures |
uk_UA |
dc.type |
Article |
uk_UA |
dc.status |
published earlier |
uk_UA |
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