Optimized calibration of cryogenic silicon thermodiodes

dc.contributor.author	Ivashchenko, O.M.
dc.contributor.author	Shwarts, Yu.M.
dc.contributor.author	Shwarts, M.M.
dc.contributor.author	Kopko, D.P.
dc.contributor.author	Sypko, M.I.
dc.date.accessioned	2017-05-26T17:35:15Z
dc.date.available	2017-05-26T17:35:15Z
dc.date.issued	2011
dc.identifier.citation	Optimized calibration of cryogenic silicon thermodiodes / O.M. Ivashchenko, Yu.M. Shwarts, M.M. Shwarts, D.P. Kopko, M.I. Sypko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 4. — С. 399-402. — Бібліогр.: 4 назв. — англ.	uk_UA
dc.identifier.issn	1560-8034
dc.identifier.other	PACS 06.20.Fb; 02.60.Ed; 02.60.Gf; 07.20.Dt
dc.identifier.uri	http://dspace.nbuv.gov.ua/handle/123456789/117784
dc.description.abstract	Shown in this paper is the efficiency of smoothing cubic spline approximation aimed at optimization of calibration of cryogenic silicon diode thermometers (SDTs). The proposed algorithm allows to significantly reduce time and material costs associated with calibration of SDTs.	uk_UA
dc.language.iso	en	uk_UA
dc.publisher	Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України	uk_UA
dc.relation.ispartof	Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title	Optimized calibration of cryogenic silicon thermodiodes	uk_UA
dc.type	Article	uk_UA
dc.status	published earlier	uk_UA