Deiev, O.S.; Kiprich, S.K.; Vasilyev, G.P.; Yalovenko, V.I.; Ovchinnik, V.D.; Shulika, M.Y.
(Вопросы атомной науки и техники, 2017)
An experimental method of determining the active region thickness of Si planar detector was used. The method based on the dependence the depletion layer thickness from voltage applied to the detector (U = 0...60 V ). The ...