Odarych, V.A.; Sarsembaeva, A.Z.; Sizov, F.F.; Vuichyk, M.V.
(Semiconductor Physics Quantum Electronics & Optoelectronics, 2005)
Properties of cadmium telluride films on silicon substrate, distribution of thickness and refraction index over the sample area were investigated by the ellipsometric method. It was ascertained that the refraction index ...