Brus, V.V.; Kovalyuk, Z.D.; Parfenyuk, O.A.; Vakhnyak, N.D.
(Semiconductor Physics Quantum Electronics & Optoelectronics, 2011)
The envelope method was used to determine optical constants of TiO₂ thin
films deposited by DC reactive magnetron sputtering and electron-beam evaporation
techniques. The density and thickness of the thin films were ...