Relaxation dynamics in the high-frequency crystal-field spectroscopy of PrNi₅ point contacts

Relaxation dynamics in the high-frequency crystal-field spectroscopy of PrNi₅ point contacts

Balkashin, O.P. ; Sukhodub, G.L. ; Yanson, I.K. ; Brill, T.M. ; Jansen, A.G. M. ; Wyder, P.

Тема: Динамика кристаллической решетки

Інший ID: PACS: 72.30.+q, 73.40.Jn

URI: http://dspace.nbuv.gov.ua/handle/123456789/129541

Посилання: Relaxation dynamics in the high-frequency crystal-field spectroscopy of PrN₅ point contacts / O.P. Balkashin, G.L. Sukhodub, I.K. Yanson, T.M. Brill, A.G. M. Jansen, P. Wyder // Физика низких температур. — 2001. — Т. 27, № 1. — С. 90-95. — Бібліогр.: 21 назв. — англ.

Дата: 2001

Завантажень: 337

Relaxation dynamics in the high-frequency crystal-field spectroscopy of PrNi₅ point contacts

Анотація:

High-frequency point-contact (PC) spectroscopy is used to investigate the relaxation processes kinetics in the intermetallic rare-earth compound PrNi₅. A difference is observed in the spectral response between the conventional low-frequency PC data and the response signal to microwave and farinfrared radiation of PrNi₅-Cu point contacts. This difference is connected with the f-shell electronic levels (CEF levels) and phonon temporal dynamics. The phonon reabsorption contribution to the spectra above the Debye energy decreases for microwave and far-infrared frequencies. However, the crystal-field contribution to the spectra at 4.2 meV is enhanced for high frequencies reflecting the relaxation processes specific for these Fermi-statistics electron excitations. The characteristic frequency for CEF-level relaxation is evaluated as ~200 GHz.

Показати повний запис статті