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Electrical and optical parameters of Cu₆PS₅I-based thin films deposited using magnetron sputtering
Репозиторій DSpace/Manakin
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- Фізико-технічні та математичні науки
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- Відділення фізики і астрономії
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- Semiconductor Physics Quantum Electronics & Optoelectronics
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- Semiconductor Physics Quantum Electronics & Optoelectronics, 2016, том 19
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- Semicond. Physics Quantum Electronics & Optoelectronics, 2016, № 1
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Electrical and optical parameters of Cu₆PS₅I-based thin films deposited using magnetron sputtering
Інший ID:
DOI: 10.15407/spqeo19.01.079
PACS 78.40.Ha, 77.80.Bh
PACS 78.40.Ha, 77.80.Bh
Посилання:
Electrical and optical parameters of Cu₆PS₅I-based thin films deposited using magnetron sputtering / I.P. Studenyak, A.V. Bendak, V.Yu. Izai, P.P. Guranich, P. Kúš, M. Mikula, B. Grančič, M. Zahoran, J. Greguš, A. Vincze, T. Roch, T. Plecenik // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 1. — С. 79-83. — Бібліогр.: 17 назв. — англ.
Підтримка:
Andrii Bendak (contract number 51501903) is strongly grateful to the International Visegrad Fund scholarship for funding the project.
Дата:
2016
Переглядів:
874
Завантажень:
387
Анотація:
Cu₆PS₅I-based thin films were deposited onto silicate glass substrates by nonreactive radio-frequency magnetron sputtering. The chemical composition of thin films was determined using energy-dispersive X-ray spectroscopy. Electrical conductivity of Cu₆PS₅I-based thin films was studied as dependent on chemical composition. Optical transmission spectra of Cu₅.₄₆P₁.₆₈S₅.₀₆I₀.₈₀ thin film were investigated within the temperature interval 77…300 K; temperature behaviour of optical absorption spectra and dispersion of the refractive index were also studied. Temperature dependences of the energy position of absorption edge, Urbach energy and refractive index of Cu₅.₄₆P₁.₆₈S₅.₀₆I₀.₈₀ thin film have been analyzed.
