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Structural and optical studies of (Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films deposited at different technological conditions
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- Відділення фізики і астрономії
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- Semiconductor Physics Quantum Electronics & Optoelectronics
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- Semiconductor Physics Quantum Electronics & Optoelectronics, 2014, том 17
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- Semicond. Physics Quantum Electronics & Optoelectronics, 2014, № 3
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Structural and optical studies of (Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films deposited at different technological conditions
Інший ID:
PACS 78.40.Ha, 77.80.Bh
Посилання:
Structural and optical studies of (Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films deposited at different technological conditions / I.P. Studenyak, Yu.Yu. Neimet, Y.Y. Rati, M.Yu. Buchuk, S. Kokenyesi, L. Daroci, R. Bohdan // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 3. — С. 232-236. — Бібліогр.: 20 назв. — англ.
Підтримка:
The authors are grateful to the TAMOP Grant (TAMOP
4.2.2.A-11/1/KONV-2012-0036 project) which is cofinanced
by the European Union and European Social
Fund. Yuriy Neimet (contract number 51301014) is
strongly grateful to the International Visegrad Fund
scholarship for the funding of the project.
Дата:
2014
Переглядів:
788
Завантажень:
328
Анотація:
(Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films were deposited upon a quartz substrate by
rapid thermal evaporation at temperatures 1050, 1200, and 1350 °C. Structural studies of
the as-deposited thin films were carried out by scanning electron microscopy and atomic
force microscopy. It is shown that the surfaces of all the films were covered with Ag-rich
crystalline micrometer sized cones. The optical transmission spectra for as-deposited thin
films were studied at room temperature. The absorption spectra in the region of its
exponential behaviour were analyzed, the dispersion dependences of refractive index as
well as their variation depending on evaporation temperature were investigated.
