Перегляд за автором "Yefanov, O.M."

Сортувати за: Порядок: Результатів:

  • Anisotropy of elastic deformations in multilayer (In,Ga)As/GaAs structures with quantum wires: X-ray diffractometry study 
    Strelchuk, V.V.; Kladko, V.P.; Yefanov, O.M.; Kolomys, O.F.; Gudymenko, O.I.; Valakh, M.Ya. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2005)
    Using the method of high-resolution X-ray diffraction (HRXRD), we have studied 17-period In₀.₃Ga₀.₇As/GaAs multilayer structure with self-assembled quantum wires (QWRs) grown by the MBE and subjected to postgrowth rapid ...
  • Influence of small miscuts on self-ordered growth of Ge nanoislands 
    Gudymenko, O.Yo.; Kladko, V.P.; Yefanov, O.M.; Slobodian, M.V.; Polischuk, Yu.S.; Krasilnik, Z.F.; Lobanov, D.V.; Novikov, А.А. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2011)
    Using high-resolution X-ray diffraction (HRXRD), we have investigated lateral ordering the nanoislands formed from Ge wetting layer of various thicknesses deposited on a strained Si₁₋xGex sublayer. We observed that the ...