Vlaskin, V.; Vlaskina, S.; Berezhinsky, L.; Svechnikov, G.
(Semiconductor Physics Quantum Electronics & Optoelectronics, 2009)
The reliability of AC thick-film EL devices has been studied. The AC thickfilm
EL devices were fabricated by Novatech Inc. using the industrial print screen
technology. The analysis of reasons for failure has been proposed. ...