Eliseev, S.P.; Nikulin, V.Ya.; Silin, P.V.
(Вопросы атомной науки и техники, 2008)
The soft X-ray (SXR) measurements were received with help of the fast semiconductor detectors SPPD11-04 with exposure time about 1.5 ns. Observation directions were at 45° and 90° to the chamber axis. The SXR dependence ...