Neimash, V.B.; Poroshin, V.M.; Shepeliavyi, P.Ye.; Yukhymchuk, V.O.; Melnyk, V.V.; Makara, M.A.; Kuzmich, A.G.
(Semiconductor Physics Quantum Electronics & Optoelectronics, 2013)
The influence of tin impurity on amorphous silicon crystallization was
investigated using the methods of Raman scattering, Auger spectroscopy at ion etching,
scanning electron microscopy and X-ray fluorescence microanalysis ...